Oxford Instruments Asylum Research Releases nanoTDDB high voltage accessory for Jupiter XR, Large Sample Atomic Force Microscope

SANTA BARBARA, Calif.--(BUSINESS WIRE)-- #AtomicForceMicroscopy--Oxford Instruments Asylum Research today announces the release of its new nanoscale time-dependent dielectric breakdown (nanoTDDB) high voltage accessory for the Jupiter XR atomic force microscope (AFM). The NanoTDDB technique measures the voltage at which a material undergoes dielectric breakdown. This unique nanoTDDB accessory expands the...

Click to view original post